Specialist : Barış DEMİRCİ

E-mail :


Ambios Quesant Universal SPM model is a small sample AFM that rasters the sample rather than the probe and has a small mechanical path that allows atomic resolution AFM. It has a built in 250X video microscope, easy change cantilever, a 40µm x 40µm x 4µm scan tube assembly and Acoustic/Vibration Isolation Chamber (AVIC) is included.

Quesant Universal SPM features include:

     250X video microscope with 90 degree top-down view for easy alignment and positioning of the AFM probe. Tip and surface view is 45 degrees during STM operation.  

     Easy-to-use controls permit rapid probe exchange and alignment, sample approach, and intuitive display and adjustment of all SPM operating parameters. There is a micrometer-driven X-Y translation of the scan head over the sample.

     Contact and non-contact AFM imaging modes.

     Patented Analoop™ analog PID feedback loop that is digitally controlled which allows more accurate data gathering and has an extremely fast sampling frequency.

Staging Systems :

Maximum sample size: 25(x) X 25(y) X 8(z)mm

X-Y translation: +/- 5mm (manual)

Sample mounting: 20mm diameter platform

Simple exchange of scanners, probe modules (i.e. AFM to STM), and cantilevers

Video view: 250X, 0.75mm FOV, 90° to sample

Sample illumination: LED

Realtime image acquisition software features include:

Realtime surface leveling, adjustment to PID controls, adjustment of scan controls, undo/redo functions to allow capture of previous or partial images, image capture up to 1024 lines X 1024 pixels, slope shading or perspective illumination, hardware and software image zoom.

Image analysis and rendering software features include:

Variety of curve fitting/leveling mechanisms on a line-by-line or entire image basis, image streak and/or spot artifact removal, 2D FFT analysis with unique image conjugate erase functions that allows easy identification and removal of periodic features, line profile extraction on single or multiple lines, automated bimodal histogram function for statistically significant step height measurements.