Please contact the device specialist before making any requests.

Specialist : Dr. Bilge GEDİK ULUOCAK

Phone : +90 212 359 72 30
E-mail : gedikb@bogazici.edu.tr

FEI-Philips XL30 Environmental Scanning Electron Microscope with Field Emission Gun (Equipped with EDAX-Energy Dispersive X-ray Analysis Unit) is available in our laboratory.

It is fundamental to observe, examine, and accurately describe microscopic and submicroscopic structures in scientific research. High-magnification, high-resolution electron microscopes and X-ray analyzers are the most powerful systems that best perform this task. Electron microscopes are the basic research tools to obtain microstructures which can be simultaneously examined along with the topographic and microchemical properties of the sample.

The FEI-Philips XL30 ESEM-FEG at our center is an environmental SEM with a field-emission electron gun. It is equipped with secondary electron (SE) and backscattered electron (BSE) detectors, gaseous secondary electron detectors, and an Energy Dispersive X-ray analysis system (EDS).

The major advantage of using environmental scanning electron microscopy (ESEM) is that it enables imaging of non-conductive materials without making them conductive.

The Energy Dispersive X-ray analysis system (EDS) makes it possible to define the elemental contents of the analyzed material surfaces qualitatively and semi-quantitatively, to determine weight percentages of the elements and to obtain analytical maps showing the distribution of the constituent elements on the surface of the specimen.

Application Areas:

• Surface and cross section morphology of a polymer or composite
• Distribution of additives in a material
• Examining a porous material and pore size measurement
• Measuring coating thickness
• Size distribution of nano-materials
• Pollens, plants, seeds, insects
• Cell growth on a surface
• Structures in cement-based materials