Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

Please contact the device specialist before making any requests.

Specialist : Barış DEMİRCİ

Phone : +90 212 359 74 20
E-mail : baris.demirci@bogazici.edu.tr


Ambios Quesant Universal SPM is available in our laboratory.

Quesant Universal SPM features include:

  • 250x video microscope with 90 degree top-down view for easy alignment and positioning of the AFM probe. Tip and surface view is 45 degrees during STM operation.
  • Easy-to-use controls permit rapid probe exchange and alignment, sample approach, and intuitive display and adjustment of all SPM operating parameters. There is a micrometer-driven X-Y translation of the scan head over the sample.
  • Contact and non-contact AFM imaging modes.
  • Patented Analoop™ analog PID feedback loop that is digitally controlled which allows more accurate data gathering and has an extremely fast sampling frequency.
  • Acoustic/Vibration Isolation Chamber (AVIC)

Staging Systems :

  • Maximum sample size: 25(x) x 25(y) x 8(z)mm
  • X-Y translation: +/- 5mm (manual)
  • Sample mounting: 20mm diameter platform
  • Simple exchange of scanners, probe modules (i.e. AFM to STM), and cantilevers
  • Video view: 250x, 0.75mm FOV, 90° to sample
  • Sample illumination: LED

Realtime image acquisition software features include:

  • Realtime surface leveling
  • Adjustment to PID controls
  • Adjustment of scan controls
  • Undo/redo functions to allow capture of previous or partial images
  • Image capture up to 1024 x 1024 pixels
  • Slope shading or perspective illumination
  • Hardware and software image zoom

Image analysis and rendering software features include:

  • Variety of curve fitting/leveling mechanisms on a line-by-line or entire image basis
  • Image streak and/or spot artifact removal
  • 2D FFT analysis with unique image conjugate erase functions that allows easy identification and removal of periodic features
  • Line profile extraction on single or multiple lines
  • Automated bimodal histogram function for statistically significant step height measurements